products categories

• Product-Showcase
  • Overview
  • Available-Models
  • Guide
• Spectroscopic-Reflectometer-SR-Series
  • SR-and-Film-Thickness-Measurement-Tools
• Spectroscopic-Ellipsometer-SE-Series
  • Ellipsometer-Microspectrophotometer-SE-MSP
  • Infrared-Spectroscopic-Ellipsometer-IRSE
  • Spectroscopic-Ellipsometer-DUV-Vis-NIR
  • Spectroscopic-Ellipsometer-SE-Solar
  • Spectroscopic-Ellipsometer-with-Automation
  • TFProbe-Ellipsometer-for-Education-eSE
• Microspectrophotometer-MSP-Series
  • Economical-Microspectrophotometer-eMSP
  • Microspectrophotometer-MSP-DUV-Vis-NIR
• Film-Thickness-Mapping-System
  • SRM-Film-Thickness-Mapping-Tools
• TFProbe-Wafer-Measurement-Tools
  • Wafer-Thickness-Measurement-Tool
• Integrated-In-line-In-Situ-Metrology
  • CMP-Process-Monitoring
• TFProbe-Software
  • TFProbe-2.X
  • TFProbe-3.X
• DUV-Vis-NIR-Light-Source
  • DUV-Vis-NIR-Light-Source-DHL-3020
• Accessories