Analytical Service

Although Angstrom Sun Technologies Inc.mainly engages in the design and manufacture of  thin film characterization optical metrology tools(Spectroscopic Ellipsometers, Reflectometers and microspectrometers), we also provide comprehensive and related services to meet customer's needs. There are broad range of tools available in house. In addition, we have established cooperation or partnership with other service labs by providing complimentary data in several different fields where experts could work together to answer all your questions. Such practice provided valuable input to several attorney firms for Intellectual property (IP) rights related legal actions in past. As the first of thin film metrology provider for next negeration 450mm semicondutctor processing developement, we are able to offer service for 450mm size wafer characterization in house too.

Our goal is to meet your needs with our best efforts. Here is what was said by our customer about us:

“As spectroscopic ellipsometry rapidly moved to the top of our list of required metrology for our development, Dr. Sun and his team at Ångstrom Sun Technologies provided our technical staff with strong technical support in the time leading up to our instrument purchase. When we decided to move ahead with acquisition of an Ångstrom Sun tool, Richard and his team met a very aggressive manufacturing and shipment schedule, which provided a tremendous benefit to us. And as we develop our own expertise in running the instrument, the Ångstrom Sun team continues to provide rapid, high-quality support for us. We’ve been very happy with our relationship with Ångstrom Sun and look forward to continuing to work with them.” by David Maloney, COO, Equity Solar, Inc.

 
Analytical Service for Film Thickness and Optical Constants (the refractive index and the extinction coefficient)
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